The Sinopec C Beamline (BL04B) is a medium-energy X-ray beamline based on bending magnet sources with comprehensive experimental capabilities. It comprises two endstations dedicated to medium-energy spectroscopy and nano-CT respectively. This beamline is designed to characterize the local atomic and electronic structures of materials, as well as their nanoscale morphological features. It enables researchers to conduct scientific studies including energy, materials science, environmental science and physics.
Beamline Layout
| Medium-energy Spectroscopy |
Energy Range: |
2.3-12 keV |
|
Energy Resolution: |
2×10-4@2.47 keV | |
|
Flux: |
5×109phs/s@2.47 keV | |
|
Nano-CT |
Energy Range: |
6-12 keV |
|
Spatial Resolution: |
30nm@9keV | |
|
Energy Resolution: |
5×10-4@9keV | |
|
Flux: |
1.5×109phs/s |
Medium-energy ion chamber, Medium-energy experimental platform
7-element fluorescence detector, Atmospheric experimental platform, Atmospheric ion chamber
Nano CT Endstation
Ellipsoidal focusing mirror, Sample stage, Visible light microscope, Zone plate
Phase ring, Bertrand lens, Helium gas pipeline, Imaging detector
·TEY (Total Electron Yield) measurements are performed inside a vacuum chamber. This technique detects the full range of electrons emitted from the sample and is primarily used to analyze surface information. The probing depth for the sulfur K-edge is approximately 70 nm.
·Fluorescence XAFS (X-ray Absorption Fine Structure) enables bulk-sensitive characterization and is suitable for samples with low elemental concentrations.
·Transmission XAFS is the optimal method for XANES and EXAFS measurements of elements at high concentrations in samples.
