·TEY (Total Electron Yield) measurements are performed inside a vacuum chamber. This technique detects the full range of electrons emitted from the sample and is primarily used to analyze surface information. The probing depth for the sulfur K-edge is approximately 70 nm.
·Fluorescence XAFS (X-ray Absorption Fine Structure) enables bulk-sensitive characterization and is suitable for samples with low elemental concentrations.
·Transmission XAFS is the optimal method for XANES and EXAFS measurements of elements at high concentrations in samples.
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