The independently developed resonant Auger two-dimensional mapping (mRAS) at our end-station plays a crucial role in exploring the reaction kinetics at electrochemical interfaces. The related research was published in the Journal of the American Chemical Society.
Figure. (a) Schematic diagram of the in situ electrochemical testing device, (b) High-resolution X-ray diffraction spectrum (HRXRD) of PrOx thin films, (c) X-ray absorption spectroscopy (XAS) results of the Pr M4,5-edge for PrOx films under conditions of 500°C and 1 mbar pO2, with applied voltages ranging from -1.3 to 0.7 V, (d) Resonant photoemission spectra of the valence band (VB) measured at photon energies from 920 eV to 940 eV (covering the range of the Pr M5-edge) under conditions of extreme oxidation (0.7 V) and extreme reduction (-1.3 V).
K. Yang, Y. Lu, Y. Hu, Z. Xu, J. Zheng, H. Chen, J. Wang, Y. Yu, H. Zhang, Z. Liu, Q. Lu. Differentiating Oxygen Exchange Reaction Mechanisms across Phase Boundaries. J. Am. Chem. Soc. 2023, 145, 25806–25814
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