Sample preparation
(1)Sample preparation for FTIR spectrometer
The commonly used method is tablet pressing, which is suitable for powder and other samples and requires a certain proportion of KBr powder to be mixed. Grinding should be precise to avoid uneven particle scattering and uneven baseline.
(2)Sample preparation for IR microscope
The usual method used is slicing. When using the transmission mode of an infrared microscope, it is necessary to control the thickness between 5-15 μ Between m, the specific slice thickness can be determined based on the absorption of the sample. Then place the sliced sample on an infrared transparent substrate (materials such as BaF2 and CaF2). Suggested substrate size: diameter 30 mm, thickness 1 mm.
(3)Sample preparation for SNOM
a. Maximum sample size: 20 x 20 x 10 mm, detectable area: within 10 mm of the center position for the sample.
b. Sample fluctuation<1 μ m, RMS<100 nm. It can easily obtain accurate results when the fluctuation of the sample surface is smaller.
c. The sample needs to be placed on a flat gold substrate (RMS<1 nm) If ultra-thin sample is less than 50 nm.
d. The sample needs to be placed on a flat substrate such as gold-plated silicon wafers, infrared transparent substrates (such as ZnSe, BaF2) when the sample thickness is greater than 100 nm.

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