Scientific Scope
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The soft branch of the Energy materials research beamline (E-line) (BL20U2) is one of the beamlines given birth by Shanghai Synchrotron Radiation Facility (SSRF) Beamlines Project (SSRF - Phase II). It has passed CAS- process testing in October 2022 and is currently open to users. This branch beamline belongs to the E-line complex. It can operate completely independently as a soft X-ray beamline. It adopts an elliptical polarization oscillator (EPU60) as the light source and relies on a grating monochromator to deliver photons in the energy range of 130-1500eV to the experimental station called Soft X-ray Scattering station (Soft X-ray RXES/REXS station), featured with soft X-ray scattering methods. These includes both inelastic methods such as Soft X-ray Resonance emission (RXES) or Soft X-ray Resonance Inelastic Scattering (RIXS), and elastic methods such as Soft X-ray Resonance Elastic Scattering (REXS) .
 
Soft X-ray resonance emission spectroscopy (RXES) is applicable in the research field of energy materials, which includes: (a) the electronic structure and chemical state characterization of power batteries, photovoltaic devices, solar cells, and fuel cell electrode materials that play an important role in clean energy technology; (b) the electronic structure characterization of new generation catalysts (e.g those for carbon dioxide reduction and conversion to renewable energy, high-efficiency and energy-saving synthetic ammonia catalysts) providing a key basis for establishing reliable structure-activity relationships and catalytic mechanisms, furthermore guidance for the rational design of advanced catalysts and purposeful regulation of catalytic processes in the future; (c) the true bulk properties of nano-structured materials, and those even under oxide passivation. Soft X-ray elastic scattering (REXS) can be applied not only to single crystal/superlattice inorganic materials, but also to the study of semi-crystalline and even polycrystalline organic materials. In studies for inorganic materials mainly long-range information such as charge ordering, orbital ordering, and spin ordering in quantum and magnetic materials are explored. This method, combined with synchrotron radiation light sources, endows it with superior characteristics: (a) element specific - sensitivity to chemical elements comes from element specific absorption edges; (b) orbital specific - selecting the absorption edge energy of an element to excite electrons, and identifying different final orbitals through multipole transitions; (c) multipole moment analysis - REXS is sensitive to multipole moments. The study of symmetry parameters can distinguish between magnetic and non-magnetic effects, etc. In studies for organic materials mainly phase separation and the size distribution of phase domains in soft condensed structures are investigated, which can help optimizing e.g. the charge transfer characteristics of organic solar cell films and fabricating high-performance devices; This method can also be used as a highly promising non-destructive testing method to characterize the edge roughness of critical dimensions (CD) in photoresist films, one of the key materials for micro pattern processing in microelectronics technology, to meet the needs of the development of ultra large scale integrated circuits.
Beamline layout
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Figure 1. Beamline layout of BL20U2
Soft X-rays are emitted from the light source - the undulator EPU60, and are reflected by a front deflection mirror SM1 to remove higher-order harmonics. After removing the thermal load, they pass through a white slit SLIT1 and enter a planar grating monochromator (PGM1). The grating monochromator consists of three variable line spacing and groove depth gratings with center line densities of 300L/mm, 800L/mm, and 1200L/mm, respectively, which can meet the requirements of energy resolution and flux for different energies. The deflection mirror SM3 behind the monochromator can switch light back and forth between the soft X-ray station and the soft-hard combi station. Subsequently monochromatic X-rays are focused vertically through the gratings on a monochromatic slit SLIT2, and after that pass through two sets of post focusing mirrors, a toroidal mirror (SM4) to focus on the elastic scattering station (REXS) sample position, and a KB mirror group (SM5/SM6) to focus on the inelastic scattering station (or emission spectrum station, RXES) sample points.
Specifications
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 Energy Range  130~1500eV
 Energy Resolution(ΔE/E)  2×10-4 @244eV
 Beam Spot Size(H×V)@RXES  90×10 (µm2)
 Photon flux(phs/s/0.1%BW)  >1×1012 @ 244eV
 Energy Resolution of RXES Emission Spectrograph  <0.09eV @ 445eV
 Angular Resolution of REXS Scatterometer  <0.01°
Endstations
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Figure 2. BL20U2 experimental station layout
The overall layout of the experimental stations is shown in Figure 2. After soft X-ray beam exits the optical hutch, it passes first through the REXS (polymer) station (dedicated for organic materials, such as polymers or photo resists etc) or the REXS (quantum) station (dedicated for quantum materials, such as high Tc super-conductors, or topological insulators etc) and finally reaches RXES station (dedicated for battery materials or catalysis ). When the post-focusing mirror SM4 cuts into the optical path, the light is focused on the sample position of the REXS (quantum) station. The REXS (polymer) station adopts a guide rail sliding in/out method, which can switch over in operation in defocus mode upstream of the REXS (quantum) station. When the post-focusing mirror SM4 is moved out of the optical path, the light passes through and is focused to the emission RXES station by the two post-focusing KB mirrors SM5/SM6.
 
Experimental methods and principles:
(1) Soft X-ray resonance emission spectrum (RXES): When a photon with energy in the soft X-ray range (Ω) is irradiated on an object, the electrons at its core level will be excited into the conduction band, and the system will emit a certain energy (ω) of X-ray photons and de-excite to a low energy state (ω<Ω). If the core electrons are resonant excited near a certain absorption edge (similar to X-ray absorption), the subsequent X-ray emission spectrum strongly depends on the energy of the incident photon, so it is called resonant X-ray emission spectrum (RXES).
 
(2) Soft X-ray resonance elastic scattering (REXS): When a photon with energy in the soft X-ray range (Ω) is irradiated on an object, the electrons on the core level will be excited into the conduction band, in an intermediate state, and then still be de-excited with the same energy (Ω) of X-ray photons. Due to the absence of energy loss in this process, it is equivalent to complete an elastic scattering. If the core electrons are resonant excited near a certain absorption edge (similar to X-ray absorption), the subsequent X-ray elastic scattering cross-section strongly depends on the energy of the incident photon, so it is called resonant elastic X-ray scattering (REXS).
Data Acquisition and Analysis
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(1) Collection and processing of emission spectra:
Collection of emission spectrum data
The emission spectrum is collected by a vacuum internal CCD. The basic parameters of CCD are set by the beamline staff before the experiment, and the CCD detector should always be cooled under the low temperature (about -65 ° C) during the experiment. The parameters that users need to modify currently only include exposure time and the file name for data storage.
 
User data collection instructions:
Step 1: Tune the beamline photon energy to the appropriate value;
Step 2: Set the CCD exposure time and start the exposure;
Step 3: Wait for the exposure to end, and the data collection software will refresh;
Step 4: Save the data in TIF format, number and record relevant parameter information;
Repeat the above steps
 
Data saving format:
Number_ Sample abbreviation_ Incident energy in (eV)_ slit opening in μm2_ Spectrometer parameters _ Exposure time in seconds.tif
 
The setting of emission spectrograph parameters, CCD exposure time, and selection of incident energy in the RXES experiment need to be explored and tested by the beamline staff, and determined through interaction with users based on actual emission spectra data.
 
Image correction and preprocessing
The correction and preprocessing of CCD image data are achieved through a homemade software independently developed by the beamline staff, and the specific operation steps are to follow the guidance of the beamline staff.
Spectral information acquisition and data copying
a)The 2D imaging data collected by CCD will be processed by the software and output as spectral data, saved in Excel spreadsheet and image format. There is currently no reference tutorial available, and users will be instructed on site. 
b)All CCD data and processed spectral data are stored in the data folder established on the same day. Users need to copy and backup them in a safe and reliable USB flash drive brought by themselves in a timely manner, and may not delete raw data.
 
(2) Collection and processing of elastic scattering data:
(to be launched)