Hardware configuration
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KB mirrors focusing system, zone plate focusing system, 7-axis high-precision sample stage, sample and beam positioning microscope
Data acquisition equipment
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4-element backscatter detector, SDD silicon drift detector, Lytle detector, ion chamber, X-ray CCD
In-situ auxiliary equipment
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LINKAM temperature controlled stage (TMS-600),liquid nitrogen cooling device  (Oxford Cryosystems 800)
Equipment for offline observation and sample preparation
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Equipment list