(1) X-ray reflectivity measurements（XRR）
It has a unique and wide range of applications in the study of thin/ultrathin film surfaces, multilayer film interface roughness, superlattices and δ-doped structures.
(2) High Resolution X-Ray Diffraction （HR-XRD）
Improved ability to refine data and resolve crystal structures.
(3) Grazing incidence angle X-Ray diffraction（GIXRD）
Mainly used for the measurement of the external/internal/surface structure of thin film samples.
(4) Grazing incidence wide angle X-ray scattering（GIWAXS）
GIWAXS is mainly used to obtain information on the shape, size and distribution of scatterers in the surface layer of a sample by grazing X-rays onto the surface of the sample in the vicinity of a range of angles close to the total reflection angle.
(5) RSM（reciprocal space mapping）
The inverse easy space mapping measurement can observe the information such as deformation near the inverse easy lattice point, and it is one of the important methods for strain studies such as thin films and epitaxial growth.
(6）Polarography
For the study of material fabrication, mosaic structure, epitaxial film-substrate co-lattice relationship, etc.
