By replacing the detector of STXM with a CCD and scanning the samples with overlapping, combined with an iterative phase retrieval reconstruction algorithm, the high-resolution ptychography imaging can be realized with a resolution of 5-10 nm. BL08U1A endstation has successfully established this experimental method, which improves the spatial resolving capability of the Shanghai Light Source from 30 nm to 8 nm, and reduces the imaging dose to 1/12 that of the conventional STXM technology. The comprehensive performance of our ptychography platform is among the best ones in the world. [J. Phys. Conf. Ser. 2017, 849, 012033]
Comparison of ptychography PCDI) and STXM results of the star pattern (left and middle panels), as well as the resolution analysis of the PCDI image (right panel), yielding a resolution of 8.1 nm.
Virtual depth scan ptychography of a thick carbon fiber sample
The sample does not need to be rotated, only a set of 2D scanning CDI data is required to be acquired, and then the fast 3D imaging of thick samples can be realized through the virtual depth scanning ptychography method. [Optics Express 29, 16214 (2021)]
Virtual depth scan imaging results of a carbon fiber thick sample showing structures at different depths (1 μm, 19.1 μm, 25.2 μm, 34.3 μm, 38.9 μm and 45.0 μm). The 2D resolution reaches 9 nm and the depth resolution is about 0.65 μm.
During reconstruction, the virtual multislice in the sample is sequentially moved across the sample in the beam direction.
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