XEOL detects photons in the ultraviolet to near-infrared wavelengths (200-900 nm) emitted during the de-excitation process of a sample after it has been excited by X-rays. The combination of XEOL and TEY is of great advantage in the study of the valence and conduction bands of semiconductors, such as the bandgap, the defective states and the energy transfer process.
2D XEOL-TEY spectral image
The PLY and TEY spectra of nano-ZnO at O K-edge
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