Material science has developed tremendously in recent years due to rapidly improved experimental techniques based on synchrotron radiation light sources. The specific regime of very high energy resolution angle-resolved photoelectron spectroscopy (ARPES) has been proven as a successful method for the measurement of electronic states of novel functional materials, which provides a fundamental understanding on the origin of their physical properties. The successful integration of molecular beam epitaxy (MBE) and scanning tunneling microscopy/spectroscopy (STM/STS) with high-resolution ARPES at BL-03U of SSRF enables a comprehensive study on the electronic structure of novel energy-efficient and environment-friendly materials. This platform allows for the precise design, growth, and measurement of these materials with unprecedented accuracy, capitalizing on the latest advancements in material growth control, electronic state measurements, and advanced light sources. This integrated system has the potential to transition material research from "Material Observation Science" to "Material Control Science," offering a powerful fundamental tool for advancing research in this domain.