BL03HB

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Scientific Scope
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　　Based on the method of micro-beam white light Laue diffraction, taking into account the micro-beam monochromatic light diffraction, this station investigates the local microstructure and microcrystal structure of materials and their dynamic evolution over time to provide guidance for controlling the microstructure of the materials and improving the properties of the materials, and on the other hand, realises the fast collection of protein crystal diffraction data by the room temperature Laue method and the structural analysis to study the dynamic changes of the structure of the proteins under the physiological conditions in the light of the external conditions. Dynamic changes of protein structure with external conditions under physiological conditions.

Beamline Layout and Specifications
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Beamline Endstation
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protein crystal functional area

Protein crystal function area main equipment: front positioning camera, multifunctional displacement sample stage, co-axial microscope, rear ionisation chamber, Pilatus 2M detector, etc.
 
Material Function Area

The main equipment in the materials functional area: multidimensional displacement stage, co-axial microscope, Huber rotator, fluorescence detector, rear ionisation chamber, Pilatus 2M detector, etc.
Data acquisition and processing
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(1) White light Laue diffraction from protein crystals
Testing of protein crystals after preparation of relevant protein materials into protein crystals enables rapid acquisition of information such as the crystal structure of protein crystals 
(2) White light Lowe diffraction of materials 
Improved ability to refine data and resolve crystal structures 
(3) Wide-angle X-ray scattering（WAXS）
It is mainly applied to information such as the lattice structure of powders or thinner samples. 
(4) Grazing incidence wide angle scattering（GIWAXS）
GIWAXS is mainly used to obtain information on the shape, size and lattice structure of scatterers in the surface layer of a sample by grazing X-rays onto the surface of the sample in the vicinity of the range of near-total-reflection angles.